Model 2021 Analytical Tomography Holder

  • Description
  • Specification
  • Accesories
  • Consumables


Optimizes the acquisition of elemental composition and structural information in three dimensions. Developed for energy dispersive X-ray spectrometry; the beryllium holder tip and clamps reduce the addition of spurious or  system radiation. Ideal for any application that requires high specimen tilt angles.

Key Specifications

  • Optimized for energy-dispersive X-ray spectroscopy
  • Beryllium tip and clamps reduce the addition of spurious or system radiation
  • High tilt angles
  • Large field of view
  • Easy, accurate specimen loading and orientation


Holder type

Room-temperature, single tilt For most transmission electron microscopes (TEMs) with pole-piece gaps of approximately 5 mm or greater

Holder tip and clamp material

Specimen size
3 mm diameter
Wide range of thicknesses up to 250 μm

0.34 nm (in all directions)

< 1.5 nm/minute

Maximum tilt range
Up to ±80°

Field of view
Up to 1.6 mm at 70°


MODEL 130 Specimen Punch

Prepare high-quality disk specimens. A precision ground punch and die plate eliminate specimen stress and distortion. For convenient handling, a spring-loaded return plunger keeps the disk specimen on the die plate surface.
Available with or without a base and in standard sizes of 1.0 mm, 2.3 mm, and 3.0 mm. Other sizes available upon request.

 Model 160 Specimen Grinder

For transmission electron microscopy, the quality of the initial disk determines the quality of the final specimen. The Model 160 Specimen Grinder is an accurate and dependable tool for mechanically prethinning specimens. It produces specimens of uniform thickness and parallel sides within minutes. During the grinding process, a graduated scale allows the specimen thickness to be controlled easily and precisely. If further thinning via dimpling is required, the platen containing the specimen is simply ejected from the specimen grinder and installed directly into the Model 200 Dimpling Grinder.