Advanced tomography holder M2020

  • Description
  • Specification
  • Accesories
  • Consumables


The Advanced Tomography Holder is a revolutionary room-temperature specimen holder for transmission electron microscopy (TEM) featuring high-tilt and extended field of view. It allows data collection over wide-tilt and translation ranges, even in restrictive pole-piece gap geometries.

Advances in microstructural characterization require the ability to analyze structure and chemistry in three dimensions. However, most TEM techniques are limited to producing two-dimensional information. Tomography on the other hand, combines two-dimensional data sets taken at various tilt angles to produce a three-dimensional reconstruction. The Advanced Tomography Holder is ideal for electron tomography in the life and physical sciences, as well as any other application requiring high specimen tilt.

A streamlined specimen clamping mechanism eliminates the shadowing associated with most holders at high-tilt angles. The clamping mechanism accepts a standard 3 mm diameter TEM specimen and accommodates a wide range of specimen thicknesses. The specimen clamping mechanism produces an evenly distributed force on the specimen.


Key Specifications

  • Ideal for room-temperature electron tomography
  • High-tilt angles
  • Optimized specimen clamping
  • Extended field of view
  • Easy, accurate specimen loading and centering


Holder type
 Room-temperature, single tilt
For most transmission electron microscopes (TEMs)

Specimen size
3 mm diameter
Wide range of thicknesses up to 250 μm

0.34 nm (in all directions)

< 1.5 nm/minute

Maximum tilt range
Up to ±80°

Field of view
Up to 1.6 mm at 70°


MODEL 130 Specimen Punch

Prepare high-quality disk specimens. A precision ground punch and die plate eliminate specimen stress and distortion. For convenient handling, a spring-loaded return plunger keeps the disk specimen on the die plate surface.
Available with or without a base and in standard sizes of 1.0 mm, 2.3 mm, and 3.0 mm. Other sizes available upon request.

Model 160 Specimen Grinder

For transmission electron microscopy, the quality of the initial disk determines the quality of the final specimen. The Model 160 Specimen Grinder is an accurate and dependable tool for mechanically prethinning specimens. It produces specimens of uniform thickness and parallel sides within minutes. During the grinding process, a graduated scale allows the specimen thickness to be controlled easily and precisely. If further thinning via dimpling is required, the platen containing the specimen is simply ejected from the specimen grinder and installed directly into the Model 200 Dimpling Grinder.