• Description
  • Specification
  • Upgrades
  • Consumables


The NAIO AFM atomic force microscope is an ideal educational platform with a compact design and unparalleled strength for everyday work with students.

A characteristic feature of the microscope is the ease of use and high flexibility of the scanning system. The measuring range of the NAIO AFM system is 70 x 70 x 14 µm, NaioAFM has a controller integrated with the microscope base together with an anti-vibration system.


Maximum sample size up to 12 mm in diameter
Sample height up to 3.5mm
Motorized proximity of the probe to the surface of 4mm
Scanning range in soybean X and Y 70×70 µm
Scanning range in the Z axis up to 14 µm
Two view camera; looking from above and from the side.
Dimensions 204 mm x 204 mm x 160 mm
Weight 6,55 kg
Easy to move around with dedicated case.


Not available