MODEL 2050 On-Axis Rotation Tomography Holder

  • Description
  • Specification
  • Accesories
  • Consumables


Accepts either rod- or cone-shaped specimens and rotates them fully through 360º about the axis of the holder.

Key Specifications

  • Accepts either rod-shaped or conically-shaped specimens
  • Ideal for specimens prepared by focused ion beam
  • Ideal for atom probe tomography and field ion microscopy specimens

Allows 360º image acquisition and tomographic reconstruction without the loss of information due to the missing wedge


Holder type
Room-temperature, single tilt, in-plane rotation For TFS/FEI transmission electron microscopes (TEMs)

Specimen size
1.8 mm cartridge

  • Rod- or cone-shaped with electron transparent tip
  • Base diameter up to 1 mm
  • Length up to 20 mm

1.0 mm cartridge Rod- or cone-shaped specimen is affixed to the tip of the specimen post

0.34 nm (in all directions)

< 1.5 nm/minute

Maximum tilt range
Full 360° rotation, as well as indexing in three 120° increments


MODEL 130 Specimen Punch

Prepare high-quality disk specimens. A precision ground punch and die plate eliminate specimen stress and distortion. For convenient handling, a spring-loaded return plunger keeps the disk specimen on the die plate surface.
Available with or without a base and in standard sizes of 1.0 mm, 2.3 mm, and 3.0 mm. Other sizes available upon request.

Model 160 Specimen Grinder

For transmission electron microscopy, the quality of the initial disk determines the quality of the final specimen. The Model 160 Specimen Grinder is an accurate and dependable tool for mechanically prethinning specimens. It produces specimens of uniform thickness and parallel sides within minutes. During the grinding process, a graduated scale allows the specimen thickness to be controlled easily and precisely. If further thinning via dimpling is required, the platen containing the specimen is simply ejected from the specimen grinder and installed directly into the Model 200 Dimpling Grinder.