• Decription
  • Specification
  • Accesories
  • Consumables

Decription

The Phenom XL Scanning Electron Microscope (SEM) pushes the boundaries of compact desktop SEM performance. It features the proven ease-of-use and fast time-to-image of any Phenom system.
Like in case of other Phenom microscopes this model is characterized by user friendly operation software.
It is also equipped with a chamber that allows analysis of large samples up to 100 mm x 100 mm (65mm of height). A proprietary venting/loading mechanism ensures the fastest vent/load cycle in the world, providing the highest throughput. A newly developed compact motorized stage enables the user to scan the full sample area, and yet the Phenom XL is a desktop SEM that needs little space and no extra facilities.
Ease-of-use is given an extra boost in the Phenom XL with a single-shot optical navigation camera that allows the user to move to any spot on the sample with just a single click – within seconds.
With its long-life high-brightness CeB6 electron source, the Phenom XL creates state-of-the-art images with a minimum of user maintenance intervention.
The Phenom XL microscope is dedicated to easly acquire SEM images of highest quality with magnification up to 100 000x and image resolution less than 14nm.
The Phenom XL microscope is the one of the fastest SEM in the market. The time from loading the sample up to acquiring SEM image is less than 60 seconds.
A large variety of sample holders are available for facilitating the fast loading of any sample into the Phenom.
The Phenom XL is equipped with highly efficient CeB6 (Cerium Hexaboride) electron source which is characterized by high signal to noise ratio and high image resolution.
The backscattered detector (BSD) and detection chain are optimized to work together and give results with unmatched signal-to-noise images on a large variety of samples.
The Phenom XL can be upgraded with the ProSuite application platform. ProSuite offers a variety of software applications that will automate data collection and image interpretation.
Its worry-free maintenance is unique in its product category and maximizes system uptime. With these characteristics, the Phenom XL can be operated by any staff member, bringing high-magnification imaging within the reach of all lab personnel.
The Phenom XL is a complete and ready-to-go system. Unpack, install and it is ready for action without the need for a PC, laptop or other peripherals.

Specification

Easy to operate, intuitive user interface.

Sample loading time:

  • Light optical: 5 seconds
  • Electron optical: 60 seconds

Magnification range: 80 – 100 000X.

Image resolution <14nm

Easy sample navigation.

Long lifetime electron source (CeB6)

Optimized electron source for obtaining high imaging resolution.

Versatile autodiagnostic system.

Unique sample holders eliminating any risk of damage of detectors o rany part of vacuum system.

Acceleration voltage: 5kV – 20kV.

CCD navigation camera: perfect correlation between light optical and electron optical images.

Back scattered electrons detector with two modes of imaging:

  • Full
  • Topographic

Images formats:

  • TIFF
  • JPEG
  • BMP

Excellent quality to price ratio.

Low power consumption.

Accesories

  • ParticleX system
  • Secondary electron detector (SED)
  • EDS spectrometer (SDD technology)
  • Tensile strength sample holder
  • Motorized eucentric sample holder (tilt and rotation)
  • Resin mount sample insert
  • Filter insert
  • Software for automatic fibers recognition and measurement
  • Software for automatic particles recognition and measurement
  • Software for automatic pores recognition and measurement
  • Software for 3D roughness reconstruction
  • Software for EDS mapping and linescan

Consumables

10-002012-100 – Pin stubs for SEM, Ø12.7, standard pin, aluminium (Pack of 100).

10-002025-10 – Pin stubs for SEM, Ø25.4, standard stub, aluminium (Pack of 100).

AGG3347N – Adhesive carbon tabs, Agar Scientific 12 mm (Pack of 100)

AGG3348N – Adhesive carbon tabs, Agar Scientific 25 mm (Pack of 50)