MODEL 2045 Motorized Dual-Axis Tomography Holder

  • Description
  • Specification
  • Accesories
  • Consumables

Description

The Motorized Dual-Axis Tomography Holder is for transmission electron microscopy imaging or analysis that requires in situ specimen rotation. Acquiring a dual-axis tilt series enhances the information contained in the tomogram.

The Dual-Axis Tomography Holder features an optimal tilt angle range in narrow gap (~5 mm) pole-piece geometries, while maintaining microscope resolution.

A fully jeweled mechanism provides ultra-precise, in-plane specimen rotation, while maintaining eucentricity.

Key Specifications

  • Motorized rotational control for high-throughput applications
  • Interfaces with the Thermo Fisher Scientific transmission electron microscope (TEM) control system
  • Maximizes tomographic data obtained from the specimen
  • Allows for remote control of rotation and dual-axis functionality
  • Extended field of view even at high-tilt angles
  • FlexiClamp provides an easy, secure means of specimen retention
  • Non-motorized version available

Specification

Holder type
Room-temperature, single tilt, in-plane rotation For TFS/FEI transmission electron microscopes (TEMs)

Specimen size
3 mm diameter Wide range of thicknesses up to 100 μm

Resolution
0.34 nm (in all directions)

Drift
< 1.5 nm/minute

Maximum tilt range
Up to ±70°

Field of view
Up to 950 um at 70°

Accesories

MODEL 130 Specimen Punch

Prepare high-quality disk specimens. A precision ground punch and die plate eliminate specimen stress and distortion. For convenient handling, a spring-loaded return plunger keeps the disk specimen on the die plate surface.
Available with or without a base and in standard sizes of 1.0 mm, 2.3 mm, and 3.0 mm. Other sizes available upon request.

Model 160 Specimen Grinder

For transmission electron microscopy, the quality of the initial disk determines the quality of the final specimen. The Model 160 Specimen Grinder is an accurate and dependable tool for mechanically prethinning specimens. It produces specimens of uniform thickness and parallel sides within minutes. During the grinding process, a graduated scale allows the specimen thickness to be controlled easily and precisely. If further thinning via dimpling is required, the platen containing the specimen is simply ejected from the specimen grinder and installed directly into the Model 200 Dimpling Grinder.