• Description
  • Specification
  • Upgrades
  • Consumables


VistaScope is a unique AFM with flexible & full optical access to the tip/sample region. The VistaScope controller comes equipped with multiple lock-in amplifiers that allow patented photo-induced force microscopy (PiFM) and patented demodulation technique for background suppressed scattering scanning near-field optical microscopy (s-SNOM). It provides the ultimate capability in tip-enhanced optical microscopy as well as co-located AFM and far field optical techniques such as confocal Raman and confocal photoluminescence.

• Photo-induced Force Microscopy (PiFM) a revolutionary way to achieve near-field imaging via mechanical force detection.
• Background Suppressed Scattering SNOM
• Tip-enhanced Raman Spectroscopy (TERS)
• A tuning-fork AFM head is available for TERS implementation.


Beam Deflection AFM Head (AFM-BD)

  • Laser 650 or 904 nm
  • Detector noise <50 fm/root Hz above 100 KHz
  • XY motorized movement 3 mm
  • Motorized approach 5 mm
  • XY scanning range 80 x 80 µm
  • Z axis scan range 1 µm

Forward Facing Tuning Fork AFM Head (AFM-FFTF)

  • Laser 650 or 904 nm
  • Detector noise <50 fm/root Hz above 100 KHz
  • XY scanning range 12 x 12 µm
  • Z axis scan range 1 µm

High-Speed Electronics

  • FPGA-based control electronics has a section dedicated for high speed scanning probe microscopy.
    Sampling Rate: >500 MHz for channels A & B; Channel A dedicated for photodiode detection for high speed AFM
    Lockin Amplifiers: 4 independent 2-phase lockin amplifiers (LIA0 to LIA3)
    LIA Operation Frequency: Up to 10 MHz
  • High Speed Sine Wave Generator: Two channels with 160 MHz sampling rates; one reserved for scan generator for high speed AFM
  • High Speed Feedback Mode: Dual-Z feedback where the sample scanner tracks the slow varying topography and the Fast-Z Module in the AFM head tracks the fast varying topography
  • Maximum Feedback Throughput: 1 Mps with Dual-Z feedback
  • ADCs: 8X 24-bit, 156 kHz; 4X 24-bit, 156 kHz
    DACs: 8X 24-bit 156 kHz; 2X 24-bit 156 kHz; 1X 20-bit, 156 kHz
  • Noise Floor for Scan HV-Amplifiers: 140 uVrms for 150V full range


Photo-induced Force Microscopy (PiFM)
Tip-enhanced Raman Spectroscopy (TERS)
Co-located AFM and Confocal Photoluminescence (PL)
Co-located AFM and Confocal Raman