Atlas Micro-XRF – model M

  • Description
  • Specification
  • Accesories

Description

The ATLAS™ Micro-XRF spectrometer (μXRF) from IXRF Systems introduces a new world of x-ray mapping and automation. The ATLAS™ boasts the largest chamber volume and detection area (150mm2) as well as the smallest spot size (5μm) available on the market. Additionally, the ATLAS™ is complimented by the most comprehensive software suite including multi-point analysis, unattended automation, in-depth feature/image analysis, unprecedented mapping and reporting features, and much more. Instruments may be operated under air or vacuum as well as Helium flush for liquids and light element analysis.

Specification

Sample Types Solids, Liquids, Particles, Powders
Sample Chamber Size 20x18x10in. (508x457x254mm)
Measurement Media Air, Vacuum, He
Excitation Source

Primary secondary

50W / 50kV / 1mA

4W-12W / 40kV-60kV / 0.4mA-1mA

Excitation parameters

Target Materials

Tube

Spot Size

Filters

Polycapillary or Aperture Collimation

Rh (others available)

50kV, 50W, 1mA (optional 2nd tube)

≥5-1000μm

Up to 8

Geometry Top-down Beam (Perpendicular)
Detector (s)

Resolution

Active Area

SDD (Si-Pin upon request)

130-145eV

50-150mm2

Stage Motorized X,Y,Z (available)

25x25mm up to 320x320mm ranges available

Sample Travel
TotalMappingMap Scan Speed

Sample Speed

320x320x120mm

220x200mm

1-3ms/pixel

up to 300mm/second

Sample View Three Sample Positioning and Analysis Cameras
Instrument Control PC; Windows 10

Complete control of parameters, filters, cameras, optical microscopes, sample illumination and positioning, and measurement media

Power 100-240 V, 50/60 Hz
Certifications CE, RoHS, Radiation
Element Range Na-U
Dimensions 35x22x22in (890x560x560mm)
Quality and Safety CE certified RoHS, Radiation < 1 μSv/h

Accesories

Software:
Multilayer thin film
ASTM E2926-13