NaioAFM
Description
The NAIO AFM atomic force microscope is an ideal educational platform with a compact design and unparalleled strength for everyday work with students.
A characteristic feature of the microscope is the ease of use and high flexibility of the scanning system. The measuring range of the NAIO AFM system is 70 x 70 x 14 µm, NaioAFM has a controller integrated with the microscope base together with an anti-vibration system.
Specification
Maximum sample size up to 12 mm in diameter
Sample height up to 3.5mm
Motorized proximity of the probe to the surface of 4mm
Scanning range in soybean X and Y 70×70 µm
Scanning range in the Z axis up to 14 µm
Two view camera; looking from above and from the side.
Dimensions 204 mm x 204 mm x 160 mm
Weight 6,55 kg
Easy to move around with dedicated case.
Upgrades
Not available
Consumables
https://micro-shop.pl/kategoria-produktu/afm/pudelka-na-probki-afm/
https://micro-shop.pl/kategoria-produktu/afm/sondy-do-trybu-dynamicznego/
https://micro-shop.pl/kategoria-produktu/afm/podloza/
https://micro-shop.pl/kategoria-produktu/afm/standardy-kalibracyjne-afm/
For more supplies, please visit our online store Micro-Shop.