Transmission electron microscope LVEM25E

  • Description
  • Specification
  • Consumables

Description

The LVEM25 E microscope is an extended version of the LVEM25 microscope characterized by:

Five imaging modes in one instrument

  • Equipped with TEM, STEM, SEM, EDS and ED modes V Easily switch between imaging modes via intuitive software
  • Bright and dark field measurements in both TEM and STEM modes
  • SEM mode (BSE) for surface measurements V Energy Dispersive Spectroscopy (EDS) for elemental analysis
  • Electron Diffraction (ED) for understanding crystal structure

Fully integrated and portable design

  • Extremely compact, space-saving and portable design
  • Single-plug installation in nearly any laboratory environment
  • No special facility requirements (no cooling, power or anti-vibration isolation needed)

High contrast and resolution for standard samples

  • Unmatched contrast of biologic and light material samples
  • Meaningful results with reduced staining
  • Image resolution as good as 1.0 nm
  • Designed for conventionally prepared samples

Super-fast sample exchange

Specification

  • OPERATION
    • Electron gun Schottky:  field emission gun
    • Specimen size Standard Ø 3.05 mm TEM grids
    • Objective lens Magnetostatic
    • Projective lens Electrostatic
    • Specimen movement x, y: ± 1 mm z: ± 0.5 mm
    • Tilt holder ± 6°

    IMAGING MODES

    TEM

    • Nominal accelerating voltage 25 kV
    • Resolution 1.0 nm
    • Total magnification* 3,400 – 1,300,000×
    • Magnification in Low mag regime* 1,500×
    • Field of view 100 – 0.25 μm
    • Field of view in Low mag regime 225 μm

    TEM IMAGE CAPTURE

    • Camera sCMOS
    • Sensor size 2,048 × 2,048 pixels
    • Digitalization 16-bits

    ELECTRON DIFFRACTION

    • Probe size 500 – 8,000 nm
    • Camera length (binning 2×2) 2,000 – 5,000 pixels
    • Camera constant (binning 2×2) 17 – 40 nm pixels

    STEM

    • STEM 10 or STEM 15
      Nominal accelerating voltage: 10 kV or 15 kV
    • Resolution: 1.0 nm  or 1.3 nm
      Maximum magnification: 940,000× or  750,000× Maximum field of view: 105 μm or 80 μm

    SEM (BSE DETECTOR)
    SEM 10 or  SEM 15

    • Nominal accelerating voltage: 10 kV or 15 kV
    • Resolution: 10 nm
    • Maximum magnification 940,000× or 750,000× Maximum field of view: 105 μm or 80 μm

    EDS

    • Detector type: Silicon Drift Detector (SDD)
    • Detector active area: 30 mm2
    • X-Ray Window Windowless
    • Energy Resolution: Mn Kα ≤ 129 eV
    • Maximum throughput: 130 000 cps
    • Hardware integration: Fully embedded
    • Software: Esprit 2.3

     

Consumables

Siatki TEM z bardzo cienką strukturą – złote

Pudełka na siatki TEM

Pudełko BEEM na siatki do TEM

Pudełko na 96 siatek do TEM

https://micro-shop.pl/page/6/?s=siatki+TEM&post_type=product