Quantax EDS detector for SEM

  • Decription
  • Specification
  • Accesories
  • Consumables

Decription

Once again Bruker sets standards in performance and functionality in energy-dispersive spectrometry for the scanning electron microscope. The new generation of QUANTAX EDS features the XFlash® 6 detector series with active areas from 10 to 100 mm2.

Generation 6 provides the hardware and software technology to deliver the fastest and most reliable results:

  • Save time – new slim-line technology detectors, large area SDDs, and high performance pulse processing get the job done faster
  • Save effort – motorized detector movement and light weight design make detector handling easier
  • Gain more precision – best energy resolution provides the highest quality spectra for precise analysis
  • Gain more reliability – the world’s most comprehensive atomic database ensures most dependable low energy peak identification

Gain more accuracy – the most sophisticated algorithms for quantification and the unique combination of standardless and standard-based methods provide highest accuracy results

Specification

Wide range of detector sizes:

  • 10, 30, 60 and 100 mm2 area detectors offer ideal solutions for microanalysis and nanoanalysis

 

Best energy resolution for light element and low energy analysis:

  • 121 eV limited edition
  • 123 eV ultimate
  • 126 eV premium
  • 129 eV standard
  • All resolutions specified exceeding ISO 15632:2012

    Ultra high throughput for fastest measurements

  • New signal processing unit with hybrid technology
  • Over 1,500 kcps input count rate
  • Up to 600 kcps output count rate

    Slim-line detector technology for even more counts and lower beam currents

  • Shortest detector to sample distances for maximum solid angle in SEM, FIB-SEM and microprobe

Compact design and low weight

  • High precision slider with fully integrated motor for precise positioning
  • Improved heat sink geometry for stable measurement conditions

• Maximum detector weight of 3.75 kg

Accesories

1)Upgrade Software Esprit 2

ESPRIT 2 – The Powerful 4-in-1 Software for Microanalysis

ESPRIT 2 is the completely newly designed micro- and nano-analysis software for SEM and TEM. The SEM package unites 4 methods under a single user interface, EDS, WDS, EBSD and Micro-XRF for SEM. The 64-bit software architecture supports handling of large datasets and improves analytical flexibility.

2) Software AMICS — Advanced Mineral Identification and Characterization System

The Advanced Mineral Identification and Characterization System (AMICS) is the latest software package for automated identification and quantification of minerals and synthetic phases. The key of this package lies in its innovative imaging and analysis software capabilities. It enables Bruker’s QUANTAX energy dispersive X-ray spectrometers (EDS) systems on selected scanning electron microscopes (SEM) to become a fully automated mineral liberation analyzer (MLA).

The AMICS software is a forward-thinking quantitative analysis system. Its versatility makes it ideal for use in both earth and material science research and industry applications.

3) ESPRIT QUBE — Advanced 3D analysis of EBSD/EDS data

ESPRIT QUBE is the most advanced analytical software for 3D visualization and post-processing of data acquired with EBSD and/or EDS on electron microscopes. Whether 3D data sets are acquired automatically in FIB/SEM instruments or by using conventional metallography techniques and standard SEM, ESPRIT QUBE’s unique quaternion based approach enables true 3D data representation and analysis.

ESPRIT QUBE helps you gaining an even more profound understanding of a material’s microstructure parameters, such as dislocation density and grain boundary planes, as well as grain, inclusion and porosity metrics. It provides advanced 3D insights into the deformation mechanisms of materials, and enables experimental and theoretical crystal plasticity studies.