TEM ion milling system M1051

A state-of-the-art ion milling and polishing system offering reliable, high performance specimen preparation. It is compact, precise, and consistently produces high-quality transmission electron microscopy (TEM) specimens with large electron transparent areas from a wide variety of materials.

Key Specifications

  • Two independently adjustable TrueFocus ion sources
  • High energy operation for rapid milling; low energy operation for specimen polishing
  • Ion source maintains its small beam diameter over a wide range of operating energies (100 eV to 10 keV)
  • Adjustable 10-inch touch screen with a userfriendly interface for simple setup of milling parameters
  • Independent ion source gas control
  • Continuously adjustable milling angle range of -15 to +10°
  • Specimen holder with x-y adjustment
  • In situ viewing and image capture during milling
  • Specimen rocking or rotation with ion beam sequencing
  • Automatic, time, and manual termination
  • Liquid nitrogen-cooled specimen stage
  • Load lock designed for vacuum transfer of specimens