SEM ion polishing system M1061

A state-of-the-art ion milling and polishing system. It is compact, precise, and consistently produces high-quality scanning electron microscopy (SEM) samples for a wide variety of applications.

Key Specifications

  • High energy operation for rapid milling; low energy operation for sample polishing
  • Two independently adjustable TrueFocus ion sources
  • Ion source maintains its small beam diameter over a wide range of operating energies (100 eV to 10 keV)
  • Adjustable 10-inch touch screen with a user-friendly interface for simple setup of milling parameters
  • Create pristine cross-section samples with the Cross-section station (optional)
  • Adjustable milling angle range of 0 to +10°
  • In situ viewing and image capture during milling
  • Automatic termination by time or temperature
  • Liquid nitrogen-cooled sample stage (optional)