The Phenom Pro desktop scanning electron microscope (SEM) is one of the most advanced imaging models in the Phenom series. With its long-life high-brightness CeB6 electron source, the Phenom Pro creates state-of-the-art images with a minimum of user maintenance intervention.
The backscattered detector (BSD) and detection chain are optimized to work together and give results with unmatched signal-to-noise images on a large variety of samples.
The Phenom Pro can be upgraded with the ProSuite application platform. ProSuite offers a variety of software applications that will automate data collection and image interpretation. Some examples are Fibermetric – automated measurements and classification of fiber and filter samples, 3D Roughness Reconstruction, and Automated Image Mapping – an automated way of collecting high-resolution overview images.
A large variety of sample holders is available for facilitating the fast loading of any sample into the Phenom. From long axial-shaped samples to moist biomaterials, there is always a suitable container for the sample that needs to be analyzed.
|Light optical magnification||20 – 135x|
|Electron optical magnification range||80 – 130,000x|
|Resolution||≤ 10 nm|
|Digital zoom||Max. 12x|
|Light optical navigation camera||Color|
|Acceleration voltages||Default: 5 kV, 10 kV
Advanced mode: adjustable range between 4,8 kV and 10 kV imaging mode
|Vacuum modes||· Standard mode
· Charge reduction mode
· EDS (optional)
|Sample size||Up to 32 mm (Ø)|
|Sample height||Up to 100 mm|