EBSD Detector Quantax

Bruker’s QUANTAX EBSD analysis system provides the analyst with an easy to use and advanced tool for EBSD measurement and evaluation. The system can also be used in conjunction with the QUANTAX EDS system creating the most advanced integrated EBSD/EDS system, supported by the ESPRIT 2 software under a single user interface.

  • In-situ vertically adjustable e-Flash EBSD detector series for maximum analytical flexibility, including the ARGUS™ forescattered/backscattered electron imaging system
  • Fast acquisition with 630 patterns/s (4×4 binning) or 945 patterns/s (8×8 binning) using the e-FlashFS detector
  • High resolution pattern acquisition with the e-FlashHD, providing pattern images of up to 1600×1200 pixels and an acquisition speed of 140 patterns/s (10×10 binning) and 170 patterns/s (20×20 binning). It supports measurements at low acceleration voltages (down to 5 kV) and low beam currents (down to 0.1 nA).
  • Signal assistant for acquisition setup
  • Calibration assistant for geometrical setup
  • Inspector for checking data quality
  • Band positions are saved
  • Band detection and indexing with up to 3,000 patterns/s
  • Fast re-indexing with up to 54,000 points/s
  • Offline re-calibration
  • Advanced phase ID
  • Offline phase ID
  • EDS-assisted phase discrimination
  • LED detector position indicator and multiple features for safe operation
  • Fully software controlled detector with all electronics integrated
  • Simultaneous EBSD and EDS acquisition at up to 945 patterns/s, supported by in-situ tilt feature to optimally position both detectors
  • Easy-to-use EBSD software with a single user interface
  • Individual settings can be stored in a personal user profile

Technical Details

  1. e-Flash series – technologically leading EBSD detector architecture
  • e-Flash1000 for high speed measurements with up to 930 patterns/s (8×8 binning), improved accuracy at 630 patterns/s using 4×4 binning
  • e-FlashHR high resolution detector featuring 1600×1200 pixels native resolution; maximum speed of 170 patterns/s at 20×20 binning
  • In-situ vertical screen positioning for best available EBSD signal
  • High-accuracy guiding system with phosphor screen positioning accuracy <10 µm
  • Screen and FSE/BSE detectors replaceable by the user
  • Unique automatic detector retraction feature after measurement completion
  1. Unique ARGUS™ FSE/BSE imaging system

Sophisticated detector design, featuring:

  • Average atomic number contrast images of highly tilted samples
  • Colored-coded orientation contrast images using three independent detectors
  • Fully integrated electronics for high signal-to-noise ratio
  1. Superior support for TKD

QUANTAX EBSD provides perfect support for Transsmision Kikuchi Diffraction:

  • TKD toolkit featuring the special TKD sample holder
  • OPTIMUS™ TKD detetor head for analysis under optimal geometrical conditions
  1. Assistants and automated configuration for ease of use
  • Signal assistant for automatic camera setup
  • Automatic detector calibration for precise measurements
  • Point inspector for checking data quality at any location in a map
  1. Highest speed and reliability in acquisition and evaluation
  • Real-time data processing and indexing quality control provided by pattern streaming
  • Robust indexing along grain or phase boundaries
  • Exclusion of unwanted sample parts from measurement through map area definition
  1. Unique combined EBSD and EDS data acquisition and evaluation option
  • Advanced integration with the QUANTAX EDS system
  • Both detectors can be brought into optimum measurement position simultaneously and under vacuum
  • Simultaneous fast EBSD pattern and complete EDS spectra acquisition and evaluation possible at speeds of up to 930 patterns/s
  • Complete data re-analysis at any time
  1. Unequaled software usability, flexibility and speed
  • Storage of band positions and solutions; pattern storage possible
  • Offline phase ID and subsequent data re-analysis at ultrafast speeds of up to 54,000 points/s
  • Fast access to all measurement and postprocessing information through easy switching between the two workspaces
  • Large number of different result presentation options including point data, maps, histograms, and texture representation tools
  1. Instant access to all data for every measured point
  • Point inspector displays all available EBSD and EDS experimental data as well as corresponding simulated pattern
  1. Advanced Phase-ID – excellent solution for multi-phase and mineralogical samples

Modern computer and software technology, featuring:

  • A search for candidate phases in phase databases using chemistry / elements
  • Use of all candidate phase files for ultrafast indexing of the pattern currently selected (or detected bands when used offline)
  • Instant classification of candidate phases based on their corresponding quality of fit (simulation vs. pattern)
  • For both online and offline use

EBSD

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