Correlative microscope Delphi
Delphi is the world’s first fully integrated solution that enables fast correlative microscopy with unique overlay precision.
The system is extremely easy to use for both light- and electron-microscopy users. Even more importantly, Delphi opens the door to these techniques for all laboratories through a cost-efficient package that does not require experienced microscopy skills to image and interpret data.
In life science imaging, fluorescence microscopy provides precise localization for specific events, while electron microscopy is able to provide detailed structural information with nanoscale resolution and very good depth-of-focus.
Combined, the two techniques quickly provide a more complete picture for the user with a technique known as Correlative Light & Electron Microscopy or CLEM.
With the Delphi, CLEM is made accessible for virtually any laboratory thanks to its ease-of-use and affordability. Please also visit www.delphimicroscope.com for more detailed information.
- Sample loading time
- To navigation camera in less than 5 s
- To SEM/fluorescence microscope in less than 60 s
- Sample size – up to 8 mm diameter
- Stage – Computer-controlled motorized X and Y and focus
- Power usage – 700 W at maximum power
- Sample loading time
- Full color navigation camera with bright field and dark field modes
- 20 – 120x magnification
- Objective lens – 40x, 0.95NA, Plan Apochromatic
- Resolution – 290 nm at 550 nm emission wavelength
- Four channel solid-state (LED) excitation source with digital On/Off and intensity control
- Excitation at 392, 474, 554, and 635 nm
- Filter cube – Multiband Pinkel configuration optimized for DAPI, FITC, TRITC, Cy5 and other like fluorophores
- Camera – Scientific CMOS camera with 2048 x 2048 pixels (6.5 µm pixel size) and peak quantum efficiency of 60% at 600 nm with at least 40% QE over the range 430 – 750 nm
- Electron optics
- Source – Long-lifetime high-brightness source (CeB6)
- Acceleration voltages – Adjustable range between 4,8 kV and 10 kV
- Magnification – 20 – 130,000x
- Resolution – ≤14 nm
- Detector – High sensitivity backscattered electron detector